EMBEDDED SYSTEMS 
New generation of easy to use test coverage analysis tool category PRODUCT INNOVATIONS - Aster Technologies - coverage analysis tools
New generation of "easy to use" test coverage analysis tool

Aster Technologies introduced during electronica 2008a a new generation of "easy to use" test coverage analysis tools. This new range is powered by TestWay, the world-wide reference coverage analysis tool, helping users to quantify and qualify the test coverage for a wide range of inspection and test equipments. More than 20 test models including AOI, AXI, BST, FPT, ICT, and MDA are currently supported. go


More articles in this category:
Messe München GmbH
Messe München GmbH
category PRODUCT INNOVATIONS
more articles (55) more articles
Messe München GmbH
Messe München GmbH
Axis Network Technology - RRH
LTE remote radio head platform go
Integrated Device Technology
Flexible, low-power asynchronous dual-ports for high-end handsets go
Green Hills Software - World’s first EAL6+ OS security certification
Operating system certified to protect classified information against sophisticated attackers go
Messe München GmbH
Messe München GmbH
category ANALYSIS-MARKET-TRENDS
more articles (4) more articles
Messe München GmbH
Messe München GmbH
In-Stat’s report
New SSD makers hitting the market go
Darnell Group - strategic information
Profits will be harvested go
Darnell Group - long-term changes in power system architectures
Tectonic shifts occurring in DC-DC converter markets go
Messe München GmbH
Messe München GmbH
category NEWS
more articles (7) more articles
Messe München GmbH
Messe München GmbH
Final Report - electronica 2008
Electronics industry pins great hopes on “green electronics” go
electronica 2008
Expectations more than fulfilled: electronica automotive conference 2008 go
130 companies from ten countries:
New trade fair hybridica getting off to a fantastic start go